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射频溅射的英文

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"射频溅射"怎么读用"射频溅射"造句

英文翻译手机手机版

  • radio frequency sputtering
  • radio-frequency sputtering
  • rf sputtering

例句与用法

  • Target material was hexagonal boron nitride ( hbn ) and working gas was pure argon
    射频溅射法在si衬底上制备立方氮化硼,靶材为hbn , 。工作气体为氩气。
  • Cdte films deposited by close space sublimation have better appearance and larger grain than the films deposited by rf - sputtering and vacuum thermal evaporation
    近距离升华法制备的cdte薄膜与射频溅射和真空蒸发相比,具有其独有的特性。
  • Boron nitride ( bn ) thin films were deposited on si substrates using the conventional radio - frequency ( rf ) sputtering system , with hexagonal boron nitride ( hbn ) target and working gas of argon ( or mixture of nitrogen and argon )
    使用射频溅射( rf )系统,靶材为烧结的六角氮化硼( hbn ) ,工作气体为氩气(或氩气和氮气的混合气) ,在硅衬底上沉积氮化硼薄膜。
  • The realization of the algorithm drives the research of micro - electron structure . 2 . the la2o3 thin film is prepared by rf technology , the film is analyzed by arxps , the thickness is calculated by quantitative analysis software , the thickness of sio2 thin film between la2o3 and si is 0 . 6nm
    利用射频溅射镀膜技术在si片上制备了la _ 2o _ 3膜,通过变角xps分析和多层结构的定量计算,测得la _ 2o _ 3与si衬底之间的sio _ 2层厚度为0 . 6nm 。
  • In the paper , the two - step approach , in which the deposition procedure was divided into two sections by decrease the substrate temperature or the bias voltage , was used in order to synthesize c - bn film by the conventional js - 450a rf system . the influence of process parameters for nucleation and growth of depositing c - bn was studied separately
    本论文使用传统的js - 450a射频溅射系统利用两步法(降温降偏压法)沉积立方氮化硼薄膜,分别研究了各工艺参数对立方氮化硼成核和生长的影响。
  • It is concluded that for cvd method the cubic phase content and adhesion are highly effected by the crystal lattice mismatch between c - bn and substrate materials , however , for sputter method the crystal lattice mismatch between c - bn and substrate materials affects the quality of c - bn thin films very little . 5 n - type doping of bn thin films and preparing of bn ( n - type ) / si ( p - type ) heterojunctions adding s into the mixture of argon and nitrogen used as working gas , we sputtered 1ibn target to deposit bn thin films so as to study the n - type doping of bn thin films , and bn ( n - type ) / si ( p - type ) heterojunctions were prepared
    5实现了氮化硼薄膜的n型掺杂,成功制备出bn型)乃…型)异质结并且首次系统研究了其卜v和cv特性我们用射频溅射法溅射六角氨化硼靶,在工作气体氮和氮中混入s ,沉积氮化硼薄膜,以研究氮化硼薄膜的n型掺杂,并得到bnh型)侣i …型)异质结。
  • The c - bn thin films were deposited on si substrates using the conventional radio - frequency ( rf ) sputtering system . the c - bn / si thin film heterojunctions have been fabricated with doping into n - type ( p - type ) semiconductor by implanting s ( be ) ions into them . i - v curves of bn / si heterojunctions were obtained by the high resistance meter , c - v curves of bn / si heterojunctions were obtained by the c - v meter
    使用rf射频溅射系统,在si衬底上沉积氮化硼薄膜,用离子注入的方法在制备好的bn薄膜中分别注入s和be ,成功的制备了bn / sin - p和bn / sip - p薄膜异质结,用高阻仪测得bn薄膜表面电阻率和bn / si薄膜异质结的i - v曲线,用c - v仪测得bn / si薄膜异质结的c - v曲线。
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