高压电子显微镜的英文

• high voltage electron microscope
• high-voltage electron microscope（hvem）
• high-voltageelectronmicroscope
• hvem

• "子"英文翻译    son
• "显微镜"英文翻译    microscope
• "超高压电子显微镜" 英文翻译 :    ultrahigh voltage electron microscope; ultrahigh voltage electronic microscope; ultravoltage elctronic microscope; ultravoltage electronic microscope
• "高压电子显微镜学" 英文翻译 :    high voltage electron micro-scopy
• "高压电子显微镜检术" 英文翻译 :    high voltage electron microscopy
• "超高压电子显微镜,超高压电镜" 英文翻译 :    ultrahigh voltage electron microscope
• "高电压电子显微镜" 英文翻译 :    high voltage electron microscope
• "高压电子显微术" 英文翻译 :    high voltage electron microscopy; high-voltage electron microscopy
• "电子显微镜" 英文翻译 :    electro microscope; electro microscopy; electron microscope, em; electron microscops; electron microscopy; electronic microscope; electronmicroscope; electrun microscope; eletron microscope; ems (electron microscope); microscope electron; supermicroscope; ultramicroscope
• "高压传输电子显微镜术" 英文翻译 :    high voltage transmission electron microscopy; hvtem
• "高压透射电子显微镜" 英文翻译 :    high voltage transmission electron microscope; hvtem
• "超高压电子发射显微镜" 英文翻译 :    ultra-high voltage electron microscope
• "场电子显微镜" 英文翻译 :    field electron microscope
• "电子显微镜9" 英文翻译 :    em electron microscope
• "电子显微镜，电镜" 英文翻译 :    electron microscope
• "电子显微镜的" 英文翻译 :    dennis kunkel'sm icroscopy
• "电子显微镜像" 英文翻译 :    electron microscopical image
• "电子显微镜学" 英文翻译 :    electron microscopy
• "高压电子显徽镜" 英文翻译 :    high-voltage electron microscope
• "高电压电子显微术" 英文翻译 :    high voltage electron microscopy
• "electron microscope 电子显微镜" 英文翻译 :    ems
• "场发射电子显微镜" 英文翻译 :    field emission electron microscope
• "尝射电子显微镜" 英文翻译 :    field emission microscope
• "超级电子显微镜" 英文翻译 :    supermicroscope
• "穿透式电子显微镜" 英文翻译 :    transmission electron microscope; transmission electron microscopy

• High voltage electron microscope
  高压电子显微镜
• Although this book deals , in the main , with the now well established techniques of analysis in conventional tem , a brief treatment is also given of further techniques of defect analysis such as high voltage electron microscopy ( hvem ) and scanning transmission electron microscopy ( stem ) this treatment is by no means detailed but is included to show that the subject is still developing in an exciting and challenging way
  虽然这本书主要讲述目前公认的常规tem分析技术，对于进一步的缺陷分析技术比如高压电子显微镜（ hvem ）和透射电子显微镜法（ stem ）的简单的处理也是有的，但是这种处理并不详尽，只是列举了在令人振奋和富有挑战性的发展中课题中暴露出来的问题。