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高分辨电子显微镜的英文

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"高分辨电子显微镜"怎么读用"高分辨电子显微镜"造句

英文翻译手机手机版

  • high resolution electron microscope
  • high-resolution electron microscope

例句与用法

  • High resolution electron microscope
    高分辨电子显微镜
  • No5 : image processing based on the combination of high - resolution electron microscopy and electron diffraction ( invited paper ) , f . h . li , microscopy research and technique , 40 ( 1998 ) 86 - 100
    场发射高分辨电子显微镜在揭示原子分辨率晶体缺陷上的应用(特邀论文) ,李方华,科仪新知, 21 ( 1999 ) 8 - 15
  • No3 : revealing crystal defects at atomic level by field - emmission hrem ( invited lecture ) , f . h . li , proceedings 7th asia - pacific electron microscopy conference , singapore , june24 - 30 , 2000 , pp . 26 - 27
    场发射高分辨电子显微镜在揭示原子分辨率晶体缺陷上的应用(特邀论文) ,李方华,科仪新知, 21 ( 1999 ) 8 - 15
  • Consisted mainly of amorphous phase . hrem images showed that the ti - dlc film had a lamellar structure . the tic phase with a size of 5 nm was located at the titanium - rich regions surrounded by amorphous carbon structures in the ti - dlc film
    Ti - dlc膜的结构主要为非晶相,高分辨电子显微镜分析( hrem )表明ti - dlc膜成层状分布,膜内存在着富ti区和贫ti区, tic颗粒尺寸大约为5nm 。
  • The morphology and structure of ti - dlc films were investigated by high resolution electron microscopy ( hrem ) , atomic force microscopy ( afm ) , scanning electron microscopy ( sem ) and raman spectroscopy . the mechanical properties were investigated by a mts nano indenter xp system with a berkovich indenter . the ti - dlc film with a titanium content of 27at . %
    利用高分辨电子显微镜( hrem ) 、原子力显微镜( afm ) 、扫描电镜( sem )和拉曼光谱仪等手段分析了沉积ti - dlc薄膜的成分、形貌和结构,使用带berkovich压头的纳米压痕仪( mtsnanoindenterxp )测试了薄膜的力学性能。
  • More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution . the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ) , high resolution electron microscopy ( hrem ) , selected area electron diffraction ( saed ) , electron energy loss spectroscopy ( eels ) , xrd and hrem image simulations . the structure of nanowires is determinded to be of the type of k2ti6oi3
    利用x射线衍射( xri ) ) 、高分辨电子显微镜( hrtem ) 、选区电子衍射( saed ) 、电子能量损失谱( eels )以及x射线衍射和高分辨像模拟等分析测试手段,初步分析了这种纳米线的生长机理,探讨了她的结构和光学性能,实验结果显示这种纳米线具有kzti6o ; 3的结构,紫外一可见光吸收光谱显示, kzti6ol3纳米线禁带宽度约为3 . 45ev 。
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