透射电子的英文

• transmitted electron

• "透射"英文翻译    penetrance; transmission; ho ...
• "电子"英文翻译    electron
• "透射电子象" 英文翻译 :    transmissionelectron image
• "透射电子衍射" 英文翻译 :    transmission electron diffraction
• "透射电子显微镜" 英文翻译 :    electron transmission microscope; tra mi ion electron microscope; transmission electron microscope (tem); transmission electron microscopy; transmission electronic microscopy
• "透射电子显微镜法" 英文翻译 :    transmission electron microscopy
• "透射电子显微镜术" 英文翻译 :    transmission electron microscopy
• "透射电子显微术" 英文翻译 :    tem; transmission electron microscopy; transmission microscopy
• "普通透射电子显微镜,常规透射电子显微镜" 英文翻译 :    conventional transmission electron microscope
• "常规透射电子显微镜" 英文翻译 :    cem; conventional transmission electron microscope; ctem
• "带扫描的透射电子显微镜" 英文翻译 :    temsan
• "高压透射电子显微镜" 英文翻译 :    high voltage transmission electron microscope; hvtem
• "简易型透射电子显微镜" 英文翻译 :    simple transmission electron microscope,
• "亮场透射电子显微镜" 英文翻译 :    bright-field tra mi ion electron microscope; bright-field transmission electron micrography; bright-field transmission electron microscope
• "普及型透射电子显微镜" 英文翻译 :    popular tra mi ion electron microscope,; popular transmission electron microscope,
• "普通透射电子显微镜" 英文翻译 :    conventional tem; conventional transmission electron microscope; ctem; transmission electron microscope
• "扫描透射电子显微镜" 英文翻译 :    sca ing tra mi ion electron microscope; scanning transmission electron microscope (stem); scnning transmission electron microscope
• "透射电子显微镜分析" 英文翻译 :    tem study
• "透射电子显微镜物镜" 英文翻译 :    objective lens of the transmission electron microscope
• "透射电子显微镜显微照片" 英文翻译 :    tem micrograph
• "透射式电子探测器,发射电子探测器" 英文翻译 :    transmitted electron detector
• "透射电镜" 英文翻译 :    xtem
• "透射电镜术" 英文翻译 :    transmission electron microscopy
• "射线透射电脑断层" 英文翻译 :    xct
• "背散射电子" 英文翻译 :    back scattered electrons; backscattered electron

• Ambient air - determination of asbestos fibres - direct - transfer transmission electron microscopy method
  周围环境空气.石棉纤维的测定.直接传递透射电子显微法
• Z . zhang , m . wollgarten and k . urban , " analysis of dislocations in icosahedral al - cu - fe alloy by transmission electron microscopy " , phil . mag . lett . , 61 ( 1990 ) 125 - 131
  “铝铜铁二十面体准晶中位错的透射电子显微学分析” , <哲学杂志快报> , (英国)
• By the essential control of the initial stage of - material growth , the high - quality crystal films can be obtained . by using mocvd technology , studies of some kinds of methods such as hydrogen - terminated , nitridation , plasma - assisted , growth of two stages and sputtering buffer layers have been conducted . by measuring of xrd , pl , sem and tem , and analysis of spectra of xrd , raman scatting , oa , and pl at different temperatures , we observed that the crystal quality has been improved markedly
  本文利用mocvd技术，采用各种对si衬底处理的方法，如氢终止法、氮化法、等离子体轰击方法、两步生长法、溅射缓冲层法等进行了试验与研究，通过x射线衍射技术( xrd ) 、光致发光技术( pl ) 、扫描电子显微术( sem ) 、透射电子显微术( tem )等检测，并对其x射线衍射光谱、拉谱光谱、吸收光谱及不同温度下的光致发光光谱分析，发现外延晶体的生长质量得到了明显提高。