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射线分析的英文

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"射线分析"怎么读用"射线分析"造句

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  • x-ray analysis x
  • xrayanalysisx

例句与用法

  • Main parameter series for the x - ray analytical instrumentation
    X射线分析仪器主参数系列
  • X - ray analysis , x
    射线分析
  • X - ray kinematics , characterized by its clear physical conception , is widely used in modern semiconductor material analysis
    在现代半导体材料的x射线分析中,运动学理论由于物理思想清晰而被广泛应用。
  • Grazing x - ray fluorescence analysis is a new development approach of x - ray fluorescence technique in recent years . it will have good prospects and wide application in various fields , such as scientific research , quality monitoring and controlling
    掠射x射线分析是近年来迅速发展的一门分析技术,在科学研究以及分析检测和质量控制等生产领域都有着广泛的应用。
  • Worn surfaces of sliding pairs were characterized by scanning electron microscopy ( sem ) . chemical compositons on the worn surfaces were analyzed by energy dispersion x - ray analysis ( edax ) , and profiles and suface roughness of the worn surfaces were measured by stylus profilmetry
    用扫描电子显微镜( sem )对磨痕表面形貌进行了分析,用能量色散x射线分析( edax )对磨痕表面进行化学成分分析,并用表面轮廓仪测定了磨痕表面粗糙度和磨痕表面轮廓曲线。
  • Potash micatization is one of the main hydrothermal alteration minerals genetically related to the lead - zinc - silver deposit . it usually shows as muscovitization , sericitization and illitization . this paper presents a comprehensive study on the chemical composition of potash mica , adapted the follow methods : electronic probe , differential thermal analysis , x - ray diffraction analysis . at last , the structu ral characteristics and the geological environment of potash mica forming have been discussed
    系统地研究了钾质白云母化的矿物组成,采用了电子探针差热分析x射线分析等技术方法,探讨了钾质白云母的结构特征和形成的地质环境及找矿意义。
  • In the foreign country , neutron induced prompt gamma - ray analysis ? ipga was used to analyze the elements in substance and has been used in real production and industry " s analysis on line now . in our country , the method has been studied and used from 70 " s and has been more and more perfect . however , the neutron source they used is the isotope source
    在国外,早已开始采用中子感生瞬发射线分析法( nipga )对物质进行元素分析,如今这种方法已经应用于实际生产和工业在线分析,国内在八十年代也开始研究、应用这种方法,如今已日趋完善,然而,他们使用的中子源绝大多数仍然是同位素中子源,做为一种可行性实验方法研究,我们采用脉冲中子发生器做为中子源,自行研制的线性门电路和多道脉冲幅度分析器相配合,获取非弹性散射和俘获谱,对物质进行元素分析。
  • During the experiment of protein crystal growth in space carried by chinese re - entry capsule fsw - 2 , the crystals of barheaded goose hemoglobin suitable for x - ray analysis were obtained both in space and earth as contrast group . the diffraction data of both crystals were collected , and the structures were solved using molecule replacement methods . the comparison of structures in space and earth indicate that , the interactions among molecules in crystal and subunits of molecule in space is weakened relative to the crystal on earth , there is a contact in the
    在1994年我国返回式卫星fsw - 2上进行的空间蛋白质晶体生长实验中,获得了适合于x射线分析的空间实验组和地面对照组的斑头雁血红蛋白晶体,并收集了x射线衍射数据。应用分子置换法解析了结构,并进行了比较研究。结果显示空间晶体的分子间和分子中亚基间的相互作用趋于减弱,在
  • The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ) . the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different . the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique . by using atomic force microscope ( afm ) measured surface roughness of thin films . the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ) . the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ) . in addition , the giant magnetoresistance ( gmr ) effects of different films were also measured . the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
    利用掠入射x射线分析( gixa )技术对不同cu - fe薄膜的相结构进行了研究;利用xrd扫描及不同角度的2扫描对薄膜进行了结晶织构及残余应力分析;运用小角x射线散射( saxs )技术测量了薄膜的厚度;采用原子力显微镜( afm )观察了薄膜的表面形貌;运用能量损失谱( eds )及x射线荧光光谱( xrf )对薄膜进行了成分标定;使用振动样品磁强计测量了不同cu - fe过饱和固溶体薄膜的磁性能;最后利用自制的磁阻性能测试设备测量了真空磁场热处理前后不同薄膜的巨磁阻值。
  • Especially , it becomes more and more important in the field of analysis of the thin layer ' s characteristics , analysis of contaminants on semiconductor wafers and surface test for ferromagnetic substance . because grazing x - ray fluorescence techniques have the advantages , which are non - destructive nature analysis method , simple and economical for sample preparation , good fidelity and high precision for results
    X射线分析技术具有试样无损分析、制样经济方便、操作简单、分析结果重现性好及精度高等优点,使得这项技术在薄膜特性分析、半导体材料及磁铁材料表面检测方面受到特别的青睐。
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