导电探针的英文

发音:

"导电探针"怎么读用"导电探针"造句

英文翻译手机版

conducting probe

"导电"英文翻译 electric conduction
"探针"英文翻译 probe; sound; filling fork; ...
"电探针" 英文翻译 : electric probe
"静电探针" 英文翻译 : electrostatic probe
"压电探针" 英文翻译 : piezoelectric probe
"电探针微量分析" 英文翻译 : electron probe micro analysis
"电探" 英文翻译 : electrical resistivity survey
"探针" 英文翻译 : probe; sound; filling fork; feeler; explorer; probing pin; touch needle; wire probe
"导电" 英文翻译 : electric conduction
"电探杆" 英文翻译 : electric probe
"电探勘" 英文翻译 : electric exploration
"电探矿" 英文翻译 : electric exploration; electric prospecting; electrical ore finding
"电探器" 英文翻译 : electric explorer
"电探头" 英文翻译 : electric probe; electroprobe
"导电性，导电度" 英文翻译 : electric conductivity
"导电性，导电率" 英文翻译 : electroconductivity
"带电探测器" 英文翻译 : electrification detector
"地层电探法" 英文翻译 : electric prosepecting
"电探测器" 英文翻译 : electric explorer
"电探地基" 英文翻译 : electric geological survey
"光电探测" 英文翻译 : photoelectric detection
"光电探测器" 英文翻译 : light-sensitive cell; light-sensitive detector; photo detector; photodetector; photodevice; photoelectric detector; photoelectric pickoff
"光电探测头" 英文翻译 : photodetector head assembly
"光电探伤仪" 英文翻译 : photo defectoscope; photoelectric scanner
"光电探纬器" 英文翻译 : photoelectric weft-finder

例句与用法

The natures of the probe and formation mechanisms in these techniques are different ; therefore , the images of spm can reflect different properties of sample surface . in this work , related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied . to avoid the misreading of the same conductive tip with different state , a new method of polarization distribution mapping with nonconductive tip was proposed , and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach
本工作主要分为以下几个部分:从研究铁电薄膜的压电响应力显微镜( pfm )和扫描非线性介电显微镜( sndm )成像的影响因素入手,讨论了针尖对成像质量的影响;为降低实验成本、减小导电探针针尖状态变化对铁电薄膜微区电性能测试的负面影响,提出了以非导电探针检测微区极性分布的方法,并在现有spa - 300hv型spm的实验平台上以pfm模式成功实现了新方法对铁电薄膜极性分布的表征。