固有品质因数的英文

• basic q
• unloaded q

• "固有"英文翻译    intrinsic; inherent; inheren ...
• "品质"英文翻译    character; quality quality
• "因数"英文翻译    factor; coefficient
• "因数，品质因数" 英文翻译 :    quality factorq
• "电品质因数" 英文翻译 :    electrical quality factor
• "高品质因数" 英文翻译 :    hi-q; high quality factor
• "品质因数" 英文翻译 :    energy factor; factor of merit; factor of quality; figure of merit; figure-of-merit; foctor of merit; q factor; q quality factor; q value; q-qualit; qf; quality factor q-factor; qualityfactor
• "品质因数，优值" 英文翻译 :    figure of merit
• "品质因数表" 英文翻译 :    qmeter; quality factor meter
• "品质因数计" 英文翻译 :    quality factor meter
• "外品质因数" 英文翻译 :    external quality factor
• "优值, 品质因数" 英文翻译 :    figure of merit
• "q因数，品质因数" 英文翻译 :    q factor
• "彩色品质因数" 英文翻译 :    colour quality factor
• "槽路品质因数" 英文翻译 :    tank circuit q
• "电学品质因数" 英文翻译 :    electrical quality factor
• "高频品质因数" 英文翻译 :    high-frequency figure of merit
• "工作品质因数" 英文翻译 :    working q
• "光纤品质因数" 英文翻译 :    optical fiber merit figure; optical-fibre merit figure
• "机械品质因数" 英文翻译 :    mechanical quality factor
• "天线品质因数" 英文翻译 :    antenna figure of merit
• "外界品质因数" 英文翻译 :    external q
• "无载品质因数" 英文翻译 :    q-unloaded
• "线圈品质因数" 英文翻译 :    coil q factor; coil-q
• "有效品质因数" 英文翻译 :    effective quality factor

• Two - resonator method is using to build the draft of international measurement standard of rs for high tc superconductive thin films , in which the rs value of the hts films can be determined by unloaded q ’ s measured from two resonators by using simple formulas
  目前,国际上用双谐振器法建立高温超导薄膜微波表面电阻rs国际测试标准草案。此法是基于模式匹配方法,通过严格的推理得到简单的方程,从谐振器的谐振频率和固有品质因数可以求出超导薄膜的rs 。
• The sapphire resonator method studied in this paper is used to apply for the national measurement standard of rs for high tc superconductive thin films , in which the rs value of hts film can be determined by measuring the change of the unloaded quality factors of the loaded resonator
  在国内,本论文研制的蓝宝石介质谐振器法正在申请高温超导微波表面电阻rs国家测试标准。此法通过测量加载超导薄膜后介质谐振腔的固有品质因数的变化来确定超导薄膜的微波表面电阻。
• Sapphire resonator working in te011 + mode is used in this paper to nondestructively measure the microwave surface resistance rs of a single piece of hts thin film at 77k . the microwave surface of htsc film under test can be determined by measuring the change of the unloaded quality factors of the loaded resonator
  本文就对超导薄膜的微波表面电阻的测试进行了系统的研究。本文介绍了一种利用te011 +模式的蓝宝石介质谐振器测量高温超导薄膜微波表面电阻的方法，通过测量加载超导薄膜前后介质谐振腔的固有品质因数的变化来确定超导薄膜的微波表面电阻。