临界厚度的英文
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"临界厚度"怎么读用"临界厚度"造句
英文翻译手机版
- critical thickness
- "临界"英文翻译 critical; crisis; criticalit ...
- "厚度"英文翻译 thickness; land
- "绝缘的临界厚度" 英文翻译 : critical thickness of insulation
- "无限平板的临界厚度" 英文翻译 : critical thickness of an infinite slab
- "临界分辨厚度" 英文翻译 : critical resolution thickness
- "临界油膜厚度" 英文翻译 : oil film critical thickness
- "临界动量损失厚度" 英文翻译 : critical momentum thickness
- "临界润滑膜厚度" 英文翻译 : critical thickness of oil film
- "厚度" 英文翻译 : thickness; land (刀刃的)
- "临界" 英文翻译 : [物理学] critical; crisis; criticality◇临界角 [光学] critical angle; angle of nonslip point; 临界力 critical force; 临界量 critical quantity; 临界面 critical surface; 临界球 critical sphere; 临界区 [流] critical region; critical zone; 临界速度 [流] critical speed; critical velocity; decision speed; thrashing speed; whirling speed; 临界态 critical state; 临界体积 [物理学] critical volume; critical size; 临界条件 critical condition; 临界温度 critical temperature; 临界载荷 critical load; 临界转数 critical revolutions; 临界转速 [机械工程] critical speed; critical speed of revolution; 临界装置 [核物理] critical assembly; 临界状态 criticality; critical state; critical behaviour; 临界最大值 critical maximum
- "总厚度,全厚度" 英文翻译 : full thickness
- "板厚度" 英文翻译 : plate thickness
- "半厚度" 英文翻译 : half thickness; half-thickness
- "壁厚度" 英文翻译 : lvwt; rwt; wall thickness
- "冰厚度" 英文翻译 : ice thickness
- "层厚度" 英文翻译 : frozen layer fraction; layer thickness; layer thinner
- "稠厚度" 英文翻译 : consistency
- "大厚度" 英文翻译 : heavy section
- "带厚度" 英文翻译 : tape thickness
- "等厚度" 英文翻译 : uniform thickness
- "厚度比" 英文翻译 : thickness ratio
- "厚度表" 英文翻译 : thickness apparatus
- "厚度病" 英文翻译 : pachydermia
- "厚度规" 英文翻译 : feeler gauge; finger gage; thick gauge; thickness gage; thickness gauge; thickness meter; thickness piece
- "厚度计" 英文翻译 : idometer; micrometer; pachymeter; thickne gauge; thickness gage; thickness gauges; thickness meter; thickness scale; thickness tester
例句与用法
- Critical thickness analysis of base plate gushing in cylindrical foundation pit with confined water
承压水作用下圆形基坑底板突涌的临界厚度计算公式 - High strength and stiffness can be achieved only in polymer films thinner than a critical thickness . the relationship between the microstructure and mechanical behaviors of conducting ppy films was described based on sem techniques at the first time
同时,这些导电高分子薄膜材料的力学性能受薄膜厚度的影响:在某一临界厚度内其力学性能非常优异,超过这一厚度力学性能有所下降。 - Prior to the growth , the critical thickness , which plays a vital role in the formation process of qd , is numerically calculated in terms of the strain relaxation , and the growth is carried out under the guidance of the calculated results
在stranski - krastanow ( s - k )模式下制备了zncdse量子点,在生长量子点之前,先数值计算了系统的临界厚度,然后在该临界厚度值的指导下进行了量子点的制备。 - By reading papers on debris flow ' s triggering and confluence , we know that if we consider debris flow ' s triggering and confluence as a whole system , its whole process have many critical characteristic situation . such as , critical slope grade , critical thickness of earth source , critical precipitation , critical runoff and critical velocity of flow
本文通过对泥石流产汇流研究现状的分析得知,泥石流的产汇流可作为一个系统来研究,泥石流产汇流过程具有一系列临界特征值,如:临界坡度、土源临界厚度、临界雨量、临界流量和临界流速。 - The theoretical calculation and explanation of strain behavior during heteroepitaxy of oxides thin films : when the lattice mismatch is relative small ( for example , batio _ 3 / srtio _ 3 with a lattice mismatch of 2 . 18 % ) , the growth mode of thin films is layer - by - layer , and the critical thickness and strain relaxation can be calculated or estimated by matthews - blakeslee expressions ; when the lattice mismatch is large ( for example mgo / srtio _ 3 with lattice mismatch of 8 % ) , the strain relaxation process can be explained by theory of coherent strained islands
氧化物薄膜异质外延应变行为的理论预测和解释。对于晶格失配较小的外延体系(如batio3 / srtio _ 3 2 . 18 % ) ,薄膜以层状方式进行生长,临界厚度和应变释放过程可以用经典的matthews - blakeslee公式进行预测;对于晶格失配较大的体系(如mgo / srtio _ 3 8 % ) ,薄膜以岛状方式进行生长,应变释放过程可以由弹性应变岛的理论体系进行解释。 - When increasing the oxygen pressure , the rheed pattern changes to streaky one again . this rheed pattern transformation induced by the oxygen pressure is reversible . ex situ xps results indicate that the element ni of lno film deposited in the relatively low oxygen pressure with thickness below the critical value exists in the form as ni2 + , while as ni3 + in the relatively high oxygen pressure
随着膜厚增加而超过约30nm的临界厚度时,越来越多的晶格氧会移动到了薄膜表面,此时所提供的氧将使得后续生长的lno膜层重新形成钙钛矿结构,并以层状方式外延生长。
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