The effects of the thickness , the interfacial coupling constant and the temperature on the hysteresis of the bilayer are investigated 我们考察了薄膜厚度、界面耦合强度和温度对铁电双层薄膜电滞回线的影响。
The dependence of the curie temperature on the thickness of the film , the surface interaction and the transverse field are investigated 研究了居里温度与薄膜厚度、表面赝自旋交换相互作用强度及横场的关系。
In the case of reflection , this symmetry depends on whether a quarter wavelength fits an even or an odd number of times in the layer thickness 而在反射的情况下，这一对称性由薄膜厚度为1 / 4波长的奇数或偶数倍决定。
The symmetry properties of the optical coherence with respect to the detuning of the light frequency from resonance show up in specific symmetries of the spectra 研究表明，透射光谱随薄膜厚度的增大而展宽，光谱呈现对称性。
A fitting curve between the decay time constant and the film thickness of ybco was obtained , and the film thickness can be obtained from the fitting 另外还作出了ybco薄膜的薄膜厚度与衰减时间常量之间的关系曲线，提出了测量ybco薄膜厚度的一种新方法。
Using light interference characteristics to analyze the effects of ordinary light thin film interference on the interference fringes and on the limitation of thin film thickness 摘要利用光的干涉结果，分析了普通光源在薄膜干涉中对干涉条纹的影响和对薄膜厚度的限制。
The results indicate that with increasing the thickness of fes2 thin films , the electrical conductivity , the carrier concentration and the absorption coefficient decrease 结果表明，随着薄膜厚度的增加， fes2的电阻率升高，载流子浓度下降，在高吸收区fes2薄膜的光吸收系数也呈下降趋势。
It is found that the relation between the melting temperature and the cohesive energy of bulk materials can be used to nanomaterials , but the coefficient depends on the height of nanofilms 研究表明，块体材料熔化温度与结合能的关系式在纳米薄膜体系仍然成立，但比例系数是一个依赖于薄膜厚度的参量。
Moreover , the energy gap increasing with the film thickness when that is in the range of 70 - 130nm while the energy gap decreases with the film thickness when that is above 130nm 当薄膜厚度小于130nm时，薄膜厚度增加可导致其禁带宽度上升，当薄膜厚度大于130nm时，薄膜厚度增大反而会导致禁带宽度下降。
Finally , the angular dependence of the top layer fluorescence intensity was investigated when varying the thickness of the top layer . the experimental results are good agreement with the theoretical calculations 实验结果和理论计算符合得很好，这表明掠出射x射线荧光光谱分析技术完全可以用来分析薄膜厚度等特性。
