A high - resolution and high - precision instrument , dyamic capacitance measuring instrument of thin - film thick - ness , is introduced in this paper 摘要本文介绍一种高精度高分辨率的仪器电容式动态薄膜测厚仪。
In a word , this paper achieve the design and making of new thickness measurement instrument based on capacitance sensor both in theory and practice 总之，本文从理论到实践完成了新型电容测厚仪的设计与制造。
Abstract : some shortcomings of current ultrasonic thickness gage arediscussed . and some measures for improving the transducer , circuit and other parts of the gage are put forward 文摘:阐述了目前超声测厚仪的一些不足，并在探头和电路等方面提出了一些改进措施。
Abstract : the application of ge9030 in kmi thickness gauges was described . comparison between thickness gauge based on plc and that based on industrial computer was made 文摘:介绍了ge9030型可编程控制器在kmi测厚仪上的应用。并比较了以可编程控制器为电控核心的测厚仪与以工业控制计算机为电控核心的测厚仪的优缺点。
X - ray thickness gauge developed for plastic film is described including its working principle and hardware system . the equipment has been used successfully on bopp 摘要介绍了用于薄膜测厚的全自动往复式x射线测厚仪的研制，详述了该测厚仪的硬件组成和测厚的工作原理。该装置已成功运行在双向拉伸聚丙烯( bopp )薄膜生产线上。
Product : tachometer 、 stroboscope 、 surface speed mter 、 anemometer 、 sound level meter 、 moisture meter 、 grain moisture meter 、 thickness meter 、 coating thickness meter 、 humidity meter 、 dew point meter 、 temp . meter 、 lux meter ect 主要产品：主要产品：转速表、风速表、声级计、 （噪音计） 、水份仪（水分仪） 、温湿表、露点仪、测厚仪、涂层测厚仪、温度表、照度表、频闪转表等。
Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference , proves the principle that laser instrument of measure thickness of specimen with jones vector 摘要对椭圆偏振光在样品表面产生的反射、折射和多光束干涉的机制进行了分析，并用琼斯矢量论证了激光测厚仪的原理。
In this paper , some kinds of measurement method are compared , a new dynamic thickness measurement on - line instrument based on the new type of capacitance sensor with five boards is designed , and it can be used to replace the traditional p - ray thickness measurement instrument 本文通过对各种测量方法的比较，设计了以新型的五极板电容传感器为基础的应用于生产线的动态测厚仪器，以取代传统的测厚仪。
