In chapter 5 we discuss the design of ieee754 standard fpu ( floating point unit ) . processor and uart ( universal asynchronous receiver transmitter ) , these cores are used in this dissertation , fpu is used for floating point complex fft processor , uart is used for fft processor " s peripheral and our test platform . in chapter 6 we discuss the design for testability , including atpg , bist and jtag method , discuss the different verification and simulation strategy in soc scale facing to different modules , build up the test platform which is used to test high performance application specified digital signal processing processor . in chapter 7 we summarize the research results and creative points , and point out the further work need to do in the future 第五章提出了基于ieee754浮点标准的浮点运算处理器的设计和异步串行通信核的设一浙江大学博士学位论文计，提出了适合硬件实现的浮点乘除法、加减运算的结构，浮点运算处理器主要用于高速fft浮点处理功能，异步串行通信核主要用于pft处理器ip核的外围扩展模块以及本文所做的验证测试平台中的数据接口部分第六章提出了面向系统级芯片的可测试性设计包括了基于扫描测试atpg 、内建自测试bist 、边界扫描测试jtag设计，在讨论可测试性设计策略选择的问题上，提出了针对不同模块进行的分别测试策略，提出了层次化jtag测试方法和扫描总线法，提出了基于fpga
With the high development of the quantum circuits , the testability of the circuits will become a very serious problem . the method of testability design for rt circuits is proposed in the end of this paper , which has high testability and low hardware cost . only adding one extra mos transistor and two control ports , it can detect all open and short faults in rt circuits 随着量子电路的飞速发展，由于其本身所特有的高集成度特点，电路的测试必然会成为越来越严重的问题，因此论文在最后就电路中常见的开路、短路故障提出了rt电路的可测试性设计方法，并针对具体的mobile电路进行了可测试性设计， pspice模拟结果表明达到了可测试的目的。
Finally the design of rs decoder in this chip is described as an example of the hardware / software co - design based on asip , the construction and application of asip is also analyzed . the fourth chapter introduces the design flow using eda tools based on standard cell , then it presents the dft of this chip in detail which uses following techniques : full scan , bist and boundary scan to improve the fault coverage 第四章，在对本芯片的基于标准单元eda设计流程进行了简要说明基础上，对本芯片采用的可测试性设计进行了详细的分析和说明，本芯片中有机结合了多种可测试性设计技术：基于全扫描的方式、 bist测试技术、边界扫描技术，保证了很高的测试故障覆盖率。
In addition to the normal functional interface of a component , by adding a test interface that exposes the logical states of the component , a tester can dynamically monitor and capture states information and service calling sequence of the component during testing 更进一步，在进行组件集成测试时，本文提出了组件内置测试机制和一种提高组件可测试性的方法，通过对各交互组件进行封装并扩展测试接口，达到在测试时动态监视和捕捉组件状态和服务调用序列信息的作用。
Abstract : constant components and output opened ports in the result of high - level synthesis lead to explicit redundancy in gate - level technology mapping . explicit redundancy can not improve the performance , but increases power consumption , enlarges circuit area and decreases its testability , so it should be removed . this paper proposes a queue loop optimization algorithm to remove explicit redundancy completely which decreases the circuit area and improves the testability 文摘:高级综合结果中常量元件和输出悬空端口导致门级工艺映射结果中存在显式冗余.显式冗余无助于提高电路性能，反而增加功耗，降低电路的可测试性，使电路面积增大，应予消除.文中提出了显式冗余的队列循环优化算法，完全消除了此类冗余，从而有效地减少了生成电路的基片面积，提高了电路的可测试性
Certainly ic design involves many aspects , this paper only covers the theory , algorithm , architecture and design philosophy of the chip . it starts from the analysis of the theory and algorithm , then it presents the system architecture and some strategies used to realize chip hardware / software co - design , moreover this paper analyzes the design for testability ( dft ) of the chip , finally goes deep into the study of the verification method and its role in the whole design flow of the chip 芯片设计涉及的内容是很广泛的，但本文主要从该芯片算法原理、实现结构和设计方法等方面进行分析和研究：从信道接收芯片各个主要模块的原理和算法分析入手，提出系统的实现结构和采用软硬件协同设计的策略，然后对芯片可测试性设计进行了分析，最后对整个芯片设计的验证策略做了深入的研究。
By combination of the m model and the reliability , we can settle the problem of how to reassign the test resource and when to release the software . at the last of the paper a testability detect tool ’ s frame is put forward . we also give a particular design of pie model 针对系统测试过程的特点,本文提出了软件测试过程的极限模型,运用该模型对软件的可信度进行了定义,宏观可测试性模型和软件的可信度的结合较好的解决了系统测试阶段资源的重新分配问题和软件发布的时间点问题。
The softwares can plug , delete and replace plugins freely , so this style can benefit us in many ways . it can improve productivity and give a more efficient way to program parallely when developing a software . meanwhile , it also makes the program easy to execute , test and maintain . to research how to design and develop a plugin - styled application will be helpful and practical to modern software industry 因此它有着相当突出的优点：能够提高软件开发的并行性和开发效率，降低设计开发难度，缩短开发周期，增强应用程序的可运行性、可测试性和可维护性。因此对于如何设计开发插件式结构的应用程序的研究，对现代软件产业的发展有着重要的实际应用意义。
After that , it introduces the design for test techlonogy in this chip and some valuable and important methods of debugging and testing for both the chip and fpga systems . the main contributions of this paper are discussing the core algorithms in post - process chip and their implementations in asic . it also proposes some constructive ideas of the debugging and testing of the asic and fpga systems 另外，在芯片的可测试性方面，创造性地提出了利用芯片内部的扫描链进行功能故障测试的思想；在fpga系统的调试方面，创造性地提出来利用计算机并口的epp模式构建测试平台的思想，同时把这两种思想成功运用于芯片测试和验证中。
