Standard test method for use of 2n2222a silicon bipolar transistors as neutron spectrum sensors and displacement damage monitors 作为中子光谱传感器和位移损坏监测器的2n2222a硅双极晶体管的使用的标准试验方法
Harmonised system fo quality assessment for electronic components . blank detail specification : bipolar transistors for switching applications 电子元器件质量评估协调体系.空白详细规范.特定外壳温度的低频双极晶体管
Harmonised system of quality assessment for electronic components . blank detail specification : ambient - rated bipolar transistors for amplification 电子元器件质量评估协调体系.空白详细规范:放大用特定环境温度的双极晶体管
Specification for harmonized system of quality assessment for electronic components - blank detail specification : bipolar transistors for switching applications 电子元器件质量评定协调体系规范.空白详细规范.开关用双极晶体管
Harmonised system of quality assessment for electronic components . blank detail specification : case - rated bipolar transistors for low frequency application 电子元器件质量评估协调体系.空白详细规范.特定外壳温度低频双极晶体管
Harmonized system of quality assessment for electronic components . blank detail specification . case - rated bipolar transistors for high frequency application 电子元器件质量评估协调体系.空白详细规范.特定外壳温度高频双极晶体管
Semiconductor devices ; discrete devices ; part 7 : bipolar transistors ; section 3 : blank detail specification for bipolar transistors for switching appliances 半导体器件.分立器件.第7部分:双极晶体管.第3节:开关设备用双极晶体管的空白详细规范
Specification for harmonized system of quality assessment for electronic components - blank detail specification : case - rated bipolar transistors for low frequency amplification 电子元器件质量评定协调体系规范.空白详细规范.低频放大用管壳额定双极晶体管
Specification for harmonized system of quality assessment for electronic components - blank detail specification : case - rated bipolar transistors for high frequency amplification 电子元器件质量评定协调体系规范.空白详细规范.高频放大用管壳额定双极晶体管
Semiconductor devices ; discrete devices ; part 7 : bipolar transistors ; section 4 : blank detail specification for case - rated bipolar transistors for high - frequency amplification 半导体器件.分立器件.第7部分:双极晶体管.第4节:高频放大双极晶体管的空白详细规范
