Furthermore , the range of measurement of it was pointed out . all the analysis shows that our crsi 1il can be used to measure the spatial mid and low frequency wavefront distortion . 5 . based on our crsi and algorithm , the phase modulation characteristic of an lcslm was measured 五、利用环路径向剪切干涉仪共光路、双光束干涉的特点，全场准确测量了液晶空间光调制器的位相调制特性，并且利用它的位相调制特性实现了台阶位相板畸变波前的补偿，由此证明了液晶空间光调制器可用于控制波前畸变。
We present a charge - transport model of the photorefractive effect with two deep traps ( two deep - trap model ) based on one deep - trap model and shallow - deep - trap model . we also found dark decay behaviors which accord with the two deep - trap model in the two - beam interference experiments . the fast decay - time constant of the space - charge field is obtained as 714s 此外，在ce ： batio _ 3双光束干涉光折变光栅的暗衰减实验中，也观察到了符合双deep模型的衰减现象，得到光折变空间电场快衰减时间常数714s ，约12分钟。
In this thesis we have expatiated on the methods of the c60 thin films preparation , and the process with vacuum evaporation . the effect , which was caused by different gas pressures and other element doped , on surface morphology , structure and optical properties of c60 films have been studied by using scanning electron microscopy ( sem ) , ultraviolet visible optical absorption spectroscopy ( uv / vis ) ( type : uv - 240 ) , ellipsometer and x - ray diffraction 本论文阐述了用真空蒸镀法制备c60薄膜的方法和过程，研究了在不同气氛下生长和掺杂对c60薄膜的表面形貌、结构和光吸收特性的影响；用xl30fge型扫描电镜对c60薄膜表面形貌进行观察；用uv - 240型紫外可见光双光束分光光度计进行紫外、可见光吸收测量；用椭偏仪对薄膜进行厚度和折射率测量；用x射线衍射对薄膜结构进行分析。
The methods and systems ( including amplitude division double - beam interference system , three - beam interference system , liquid immersion type deep uv interference system and full automatic interference photolithographic system ) for amplitude division maskless laser interference photolithography are studied and compared 研究和比较了振幅分割无掩模激光干涉光刻方法和系统，包括振幅分割双光束干涉系统、三光束干涉系统、液浸式深紫外干涉系统及全自动干涉光刻系统。
