The contact areas between the four conical contact - tips and the wave - guide plate are not equal as three components of external force are unequal , and the corresponding faculae areas < wp = 8 > captured by ccd camera are different from each other 当三个方向分力大小不同时，就一个圆柱触头而言，下面的4个圆锥触头与丙烯板的接触面积不相等，因而位于丙烯板另一面的ccd摄像器所摄取到的光斑面积也不相同。
When applying an external force on a columnar contact - tip , the corresponding four conical contact - tips will be pressed to the wave - guide plate , which breaks the condition of full inner reflection in the guided wave , and faculae arise because of the leaking light 圆柱触头受外力f作用时，对应的四个圆锥触头将受到挤压，由于光波导路中导波的全内反射条件遭到破坏而产生光泄漏，在波导板上形成光斑。
It compute the parameter of deflexion caused by thermal distortion in orbit , deduce the general expression for spreading beam after thermal distortion of reflector and the center deflexion of facula received in ccd . with the method of fixing etc , it put forward the restrain measures adopted accordingly 计算了在轨运行条件下反射镜面热变形引起的表面法向偏转参数,推导了镜面变形后出射光线的通用表达式以及镜面变形前后在ccd探测器上的接收光斑中心偏转量的计算表达式。
The result was identical with x - ray diffraction analysis . the photodamage resistance ability of in : linbo3 crystals was measured by the holographity mehod and the directly observing facula distortion method . it was shown that the photodamage resistance ability of in ( 2mol % ) : linbo3 crystals was two orders of magnitude higher than that of pure linbo _ ( 3 ) crystal 本文用全息法和直接观测光斑畸变法测试了in ： linbo _ 3晶体的抗光折变能力，结果表明， in ( 2mol ) ： linbo _ 3晶体的抗光损伤(光折变)能力比纯linbo _ 3晶体的抗光损伤能力提高2个数量级以上。
The research is based on a type of low - cost desktop rapid prototyping system which replaces the laser with common uv light . in stereolithography process , once the cross - section contours is obtained through the slicing processing on stl model , it is needed to do more data processing such as inside and outside boundaries recognition , facula radius compensation , scanning and path planning to generate process control data 在光固化快速成型工艺中，当由切片软件对stl模型进行切片处理得到了层片截面轮廓后，为了形成加工控制数据，必须对截面轮廓进行诸如内外轮廓识别、工艺补偿、扫描及加工路径规划等一系列的工艺数据处理。
Because the element of the far field diagnosis system which is used to detecte facula is ccd , when it works , much types of noise will affect it , and threshold value will affect the efficient signal . in this paper , hartmann - shack wavefront sensor which can detect the phase of beam is studied , what is detected by hartmann - shack wavefront sensor can be transform into far field , and we compare this result with that detected by the far field diagnosis system , and we can know which system is more accurate 事实上， hartmann - shack波前传感器的ccd在探测光斑阵列时，也同样受ccd噪声因素的影响，并且还有波前本身的复原误差，但是hartamnn - shack波前传感器的ccd噪声影响的是波前复原精度，虽然这也将导致事后处理远场光斑的误差，但这种误差与远场测量系统的误差相比孰大孰小是本文研究的主要内容。
