We obtains three kinds of conditional failure function throught these conditional probability probabilities and depicts three - dimensional lifetime distribtution a - nd even to extend the depiction in n - dimensional lifetime distribution 通过这些条件概率得到了三类条件失效率，并用它们去刻画三个相依部件的三维寿命分布，且推广到刻画n维的情况。
According to the relation of conditional failure rate function and multivariate lifetime distribution built , we discuss some important qualities related to conditional failure rate function and apply the depiction to some examples 由建立的条件失效率与多维寿命分布之间关系，讨论了一些与条件失效率相关的重要性质，并举例说明这种刻画的运用。
First , according to the definition of n - dimensional density function , this thesis decomposes it into the conditional probability about variable alone , which can be expressed by conditional failure rate function about variable alone 本文首先根据多维密度函数的定义把它分解成关于各个变量的条件概率，而这些条件概率可以由各变量的条件失效率来表达。
Because the relation of failure rate and conditional failure rate is similar to the relation of distribution and conditional distribution , condition failure rate function has visual meanings and is e - asily obtained 由于条件失效率如同失效率一样，也有很好的直观意义且易获得。由此前人开创了通过所定义的两类条件失效率去刻画二个相依部件的二维寿命分布。
Thus , we obtain a effective and new way to depict multivariate lifetime distribution . meanwhile , at the same reason , the thesis depicts three - dim - ensional jont failure functions and extend the depiction in n - dimensio - nal joint failure rate function 同时本文还给出了三维的联合失效率的定义，与前面同样的道理用所定义的三类条件失效率去刻画它，并推广到n维的情况。
Then , according to the requirement analysis , concept design , logic design and database design , the electronic instrument failure rate database was designed and the components failure rates and n factors in gjb / z299b - 98 were established in the database 其次，按照开发关系型数据库所要求的需求分析、概念设计、逻辑设计和物理设计四个阶段，设计了电子设备失效率数据库并做了数据录库工作。
With the development of the vlsi and the decrease of the failure rate , the point of view that high reliability devices are obtained by design and manufacture has been widely accepted , which requires more advanced techniques of reliability evaluation and design 随着超大规模集成电路的发展，失效率的降低， “可靠性是设计制造出来的”已被广泛接受。因此，可靠性的发展对可靠性评价与设计技术提出了新的要求。
At last one frame of reliability simulation platform are proposed to simulate reliability level of circuits with degradation and other failure modes . it will help to take full use of test data and empirical models to predict the trend of system failure rate 提出能源系统可靠性模拟平台设计框架，该平台可用于模拟在参数漂移及其它失效模式下电路系统的可靠性水平，其特点是能够充分利用试验数据与经验模型分析系统失效率变化趋势。
How to improve the reliability of electronic instrument in design stages has got more and more attention recently . traditionally , the reliability was predicted by components failure rates based software analysis , and the design scheme was revised according to the prediction results 现今，如何在设计阶段提高电子设备的可靠性越来越引起了人们的关注，国内外通用的做法是利用基于元器件失效率数据的分析软件预测其可靠性，然后根据预测结果完善设计方案。
According to the sample theory , applied the time terminated test plan , the reliability compliance test plan was brought forward . the reliability compliance test plan was divided into two parts , residual current protection test and operation reliability test . in this paper , the test plan , the failure criterion and the program of reliability test were introduced 本文由抽样理论，采用定时截尾试验方案确定了漏电保护器的可靠性验证试验方案，漏电保护器的可靠性验证试验由成功率验证试验和失效率验证试验组成；本文还给出了漏电保护器可靠性验证试验的试验条件、试验检测方法、失效判据，以及可靠性验证程序。
