X - ray fluorescence spectrometer application . no . 57 of measurement information of center for measurement standards ( cms ) of itri . ( co - author , lawrence lin working as tbcl china area sales manager ) 10 x光萤光光谱仪之应用,量测资讯66期, 1999年3月.与林勇志(先前任职科荣股份有限公司,现任职科诚有限公司,中国分公司)合著
By using of an old monochomator , a set of grazing emission x - ray fluorescence spectrometer , which includes exciting source , fine sample stage , a monochromator , detecting sub - system and data processing sub - system , is designed and built with many limiting conditions exist in our laboratory 在装置研究方面，提出了掠出射软x射线荧光分析装置的结构布局要求，并利用实验室现有的一台单色仪，设计并建造了国内首台掠出射软x射线荧光光谱仪。
The new method of direct determination of micro amounts of elements in electrician silicon - steel chips is based on the high performance of pw 2400 x - ray fluorescence spectrometer system and its software . it can correct both the matrix effect and the influence of sample physical status . specimens of steel chips can be determined directly without any pretreatment . the method has high accuracy and precision , the operation is easy and the analysis is fast 报道了x射线荧光光谱法直接测定电工硅钢钢屑样品微量元素的新方法，校正了样品中元素间的基体效应影响和校正了钢屑样品的不同颗粒结构，不同几何形态及不同表面状态的影响，使钢屑样品可不经处理直接测定，操作简便。
